Title
Nitrogen bonding structure in carbon nitride thin films studied by soft x-ray spectroscopy
Document Type
Article
Publication Date
12-24-2001
Abstract
Soft x-ray absorption (SXAS) and emission (SXES) spectroscopies were applied to study the nitrogen bonding structure in magnetron sputtered CNx thin films. By comparing with calculated spectra of N in different model systems, N in three main bonding environments can be identified: (i) CN bonds, with a sharp SXAS peak at 399.5 eV, (ii) pyridine-like N (i.e., N bonded to two C atoms), with an x-ray absorption resonance at ∼398.5 eV, and (iii) N substituted in graphite, possibly with one sp3 carbon as a neighbor (SXAS energy ∼401 eV). These bondings are present in all CNx films analyzed; however, as shown earlier, the relative intensities between the peaks may vary with the growth conditions. Differences in the coordination of the nearest or second nearest C neighbors only cause slight changes in the peak positions and spectrum shape. © 2001 American Institute of Physics.
Recommended Citation
Hellgren, Niklas; Guo, Jinghua; Såthe, Conny; Agui, Akane; Nordgren, Joseph; Luo, Yi; Ågren, Hans; and Sundgren, Jan Eric, "Nitrogen bonding structure in carbon nitride thin films studied by soft x-ray spectroscopy" (2001). Educator Scholarship & Departmental Newsletters. 111.
https://mosaic.messiah.edu/mps_ed/111
Comments
Originally published as:
Hellgren, N., Guo, J., Såthe, C., Agui, A., Nordgren, J., Luo, Y., Ågren, H., & Sundgren, J.-E. (2001). Nitrogen bonding structure in carbon nitride thin films studied by soft x-ray spectroscopy. Applied Physics Letters, 79(26), 4348–4350. https://doi.org/10.1063/1.1428108