Probing carbon nanoparticles in CN_x thin films using Raman spectroscopy

Authors

Debdulal Roy, University of CambridgeFollow
Manish Chhowalla, University of CambridgeFollow
Niklas Hellgren, University of Illinois at Urbana-ChampaignFollow
T. W. Clyne, University of Cambridge
G. A.J. Amaratunga, University of Cambridge

Document Type

Article

Publication Date

7-1-2004

Abstract

Carbon nitride films prepared by magnetron sputtering were studied by multiwavelength Raman spectroscopy. The low/intermediate wavenumber features observed near 400 and 700 cm-1 are addressed, and the relaxation of the Raman selection rule due to curvature of the graphene planes in the nanoparticles (similar to carbon nanoonions) embedded in CNx thin films is invoked to explain the possible origin of the near 700 cm-1 band. The shift in the G peak center and ID/IG ratio are correlated with the observed microstructural changes (published before) in order to understand the effect of nitrogenation and deposition temperature on the structure of the films.

Comments

Originally published as:

Roy, D., Chhowalla, M., Hellgren, N., Clyne, T. W., & Amaratunga, G. A. J. (2004). Probing carbon nanoparticles in C N x thin films using Raman spectroscopy. Physical Review B, 70(3), 035406. https://doi.org/10.1103/PhysRevB.70.035406

Recommended Citation

Roy, Debdulal; Chhowalla, Manish; Hellgren, Niklas; Clyne, T. W.; and Amaratunga, G. A.J., "Probing carbon nanoparticles in CN_x thin films using Raman spectroscopy" (2004). Educator Scholarship & Departmental Newsletters. 98.
https://mosaic.messiah.edu/mps_ed/98