Zinc selenide analyzed by XPS

Authors

Jeffrey R. Shallenberger, Pennsylvania State UniversityFollow
Niklas Hellgren, Messiah UniversityFollow

Document Type

Article

Publication Date

6-1-2020

Abstract

© 2020 Author(s). Zinc selenide (ZnSe) was analyzed using x-ray photoelectron spectroscopy (XPS). A small notched rod was fractured in the XPS vacuum system at 6 × 10-4Pa to create an oxygen-free surface for analysis. Spectral regions for Zn 2p, Zn 3d, Zn LMM, O 1s, C 1s, Se 3d, Se 3p, and Se LMM and valence band regions were acquired. The presence of carbon could not be confirmed due to interferences between C 1s and Se LMM and between C KLL and Zn 3s. It is believed that any carbon present is very low.

Comments

Originally published as:

Shallenberger, J. R., & Hellgren, N. (2020). Zinc selenide analyzed by XPS. Surface Science Spectra, 27(1), 014020. https://doi.org/10.1116/6.0000165

Recommended Citation

Shallenberger, Jeffrey R. and Hellgren, Niklas, "Zinc selenide analyzed by XPS" (2020). Educator Scholarship & Departmental Newsletters. 80.
https://mosaic.messiah.edu/mps_ed/80