Title
The Si3N4/TiN Interface: An Introduction to a Series of Ultrathin Films Grown and Analyzed In situ using X-ray Photoelectron Spectroscopy
Document Type
Article
Publication Date
12-1-2012
Recommended Citation
Haasch, Richard T.; Patscheider, Jörg; Hellgren, Niklas; Petrov, Ivan; and Greene, J. E., "The Si3N4/TiN Interface: An Introduction to a Series of Ultrathin Films Grown and Analyzed In situ using X-ray Photoelectron Spectroscopy" (2012). Educator Scholarship & Departmental Newsletters. 92.
https://mosaic.messiah.edu/mps_ed/92
COinS
