Document Type
Article
Publication Date
10-1-1997
Abstract
Carbon nitride thin films deposited by dc unbalanced magnetron sputtering have been analyzed by high-resolution X-ray photoelectron spectroscopy (XPS) and Raman spectroscopy. The XPS data show that N 1s binding states depend on substrate temperature (Ts). By comparison with the Raman spectra, N 1s binding states are assigned in which nitrogen atoms are mainly bound to sp2 and sp3 carbon atoms at Ts = 100°C, whereas at Ts = 500°C nitrogen atoms are mainly bonded to sp2, sp3 and sp1 carbon atoms.
Recommended Citation
Hellgren, Niklas; Zheng, Wei Tao; Xing, Ke Zhao; Lögdlund, Michael; Johansson, Åsa A.; Gelivs, U; Salaneck, William R.; and Sundgren, Jan Eric, "Nitrogen 1s Electron Binding Energy Assignment in Carbon Nitride Thin Films with Different Structures" (1997). Educator Scholarship & Departmental Newsletters. 1.
https://mosaic.messiah.edu/mps_ed/1
Comments
Originally published as: Zheng, W.T., K.Z. Xing, N. Hellgren, M. Lögdlund, Å. Johansson, U. Gelivs, W.R. Salaneck, and J.-E. Sundgren. “Nitrogen 1s Electron Binding Energy Assignment in Carbon Nitride Thin Films with Different Structures.” Journal of Electron Spectroscopy and Related Phenomena 87, no. 1 (October 1997): 45–49. https://doi.org/10.1016/S0368-2048(97)00083-2.